(PR) GaN-based e-Beam Inspection and Metrology Co-developed by Startup Photo electron Soul Inc. and Nagoya University Will be Evaluated by Kioxia

It was announced today that GaN (Gallium Nitride)-based e-Beam inspection and metrology for advanced semiconductor manufacturing, jointly developed by Nagoya University startup Photo electron Soul Inc

. (PeS; CEO: Takayuki Suzuki) and the Nagoya University Amano-Honda Laboratory, will be evaluated by Kioxia Iwate Corporation (President and CEO: Koichiro Shibayama) in late September. During the crit ...